5 results
Novel thin film lift-off process for in situ TEM tensile characterization
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 216-217
- Print publication:
- August 2021
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Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue 3 / June 2019
- Published online by Cambridge University Press:
- 04 March 2019, pp. 592-600
- Print publication:
- June 2019
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Electron Beam Effects on Silicon Oxide Films – Structure and Electrical Properties
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1810-1811
- Print publication:
- August 2018
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In Situ Ptychography of Heterogeneous Catalysts using Hard X-Rays: High Resolution Imaging at Ambient Pressure and Elevated Temperature
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue 1 / February 2016
- Published online by Cambridge University Press:
- 25 February 2016, pp. 178-188
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- February 2016
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Reversible In-Situ TEM Electrochemical studies of Fluoride Ion Battery
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1620-1621
- Print publication:
- August 2014
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